Application Type
Invention
Application SubType
Invention
(10) Registration Number and Date
Status
PUBLISHED/${sta2}
(180) Expiration Date
(20) Filing Number and Date
PH 1/2024/050099 2024.02.28
(40) Publication Number and Date
PH 1/2024/050099
A1
2025.02.10
(86) PCT Filing Number and Date
(87) PCT Publication Number and Date
(85) National Entry Date
(30) Priority Details
JP 2023-122245
2023.07.27
(74) Representative Name
(EN) FEDERIS & ASSOCIATES LAW OFFICES : Suites 2002 to 2006, 88 Corporate Center, 141 Valero St., Salcedo Village Makati City 1227, Philippines
(54) Title
(EN) MICROPARTICLE MEASUREMENT SYSTEM AND MICROPARTICLE MEASUREMENT METHOD
(57) Abstract
(EN)

A microparticle measuring system includes a light source, an objective lens, an imaging lens, an image sensor, and an information processing unit. The light source emits illumination light to liquid including a microparticle to be measured. The objective lens condenses the illumination light. The imaging lens forms an image of the illumination light. The image sensor captures the image of the illumination light and outputs a captured image. The information processing unit detects the microparticle appearing in the captured image, calculates detection accuracy of microparticle detection based on the detected microparticle and a predetermined index, and determines next processing based on the calculated detection accuracy of microparticle and preset target accuracy.

(58) Citations
Cited DocumentsReferencesCategoryClaimsCitation Type
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2.0JP 2017167081 A, (SHIMADZU CORP.), 21 September 2017 Y 1-3, 6, 8-10, and 13Patent
3.0US 7295309 B1, (MORRISON, Dennis R.), 13 November 2007 A 1-14Patent
4.0JP 2021121803 A, (SONY GROUP CORP.), 26 August 2021 A 1-14Patent
Document Type Date Action
Event NameDateStatus
Filing2024.02.28Filed
Publication2025.02.10PUBLISHED
Publication2025.02.21PUBLISHED